SEM Bibliography
We aim to provide a comprehensive, up-to-date bibliography relating to
work undertaken in the Cambridge University Engineering Department in connection
with scanning electron microscopy and allied
subjects.
1951
Sander K.F: An automatic electron
trajectory tracer and contributions to the design of an electrostatic electron
microscope. PhD Dissertation, Cambridge University
(1951)
1952
McMullan D: Investigations relating to
the design of electron microscopes. PhD Dissertation, Cambridge University
(1952)
1953
McMullan D: An improved scanning electron
microscope for opaque specimens. Proc Inst Electr Engrs 100, Part II, 245-259
(1953)
McMullan, D: The scanning electron microscope and the
electron-optical examination of surfaces. Electronic Eng. (England) 25, 46-50
(1953)
Sander K.F. and Yates J.G.: The accurate mapping of electric
fields in an electrolytic tank. Proc. IEE I1, 100, pp. 167-183.
(1953)
1955
Smith K.C.A. Oatley, C.W: The scanning
electron microscope and its fields of application Br. J. Appl. Phys. 6, 391-399
(1955)
1956
Allen, J.W. and Smith, K.C.A. Electron
microscopy of etched germanium surfaces. J. Electronics 1, 439-443
(1956)
Atack D. and Smith, K.C.A.. The scanning electron microscope - A
new tool in fibre technology. Pulp Paper Mag. Canada 57, 245-251
(1956)
Bowden F.P. and McAuslan J.H.L. Slow decomposition of explosive
crystals. Nature (London) 178, 408-410. (1956)
Smith K.C.A: The scanning
electron microscope and its fields of application. PhD Dissertation, Cambridge
University (1956)
1957
J.H.L. McAuslan and K.C.A.
Smith, "The direct observation in the scanning electron microscope of chemical
reactions," in Electron Microscopy: Proceedings of the Stockholm Conference,
Sept. 1956, edited by F. S. Sjostrand and J. Rhodin (Academic Press, New York,
1957) pp 343-345.
Oatley C.W. and Everhart T.E: The examination of p-n
junctions in the scanning electron microscope. J Electron 2, 568-570
(1957)
Wells O.C: The construction of a scanning electron microscope and
its application to the study of fibres. PhD Dissertation, Cambridge University
(1957)
1958
Everhart T.E: Contrast formation in the
scanning electron microscope. PhD Dissertation, Cambridge University
(1958)
Oatley C.W: The scanning electron microscope New Sci. June Issue,
pp. 153-155. (1958)
Spreadbury P.J: Investigations relating to the design
of a simple scanning electron microscope. MSc Dissertation, Cambridge University
(1958)
1959
Everhart T.E., Wells O.C. and Oatley,
C.W: Factors affecting contrast and resolution in the scanning electron
microscope. J. Electronics Control 7, 97-111 (1959)
Smith K.C.A: Scanning
electron microscopy in pulp and paper research. Pulp Pap Mag Can Tech Sect 60,
T366-T371 (1959)
Tipper C.F, Dagg D.I. Wells O.C: Surface fracture
markings on alpha iron crystals. J. Iron and Steel Inst. (GB), 193, 133-141,
(1959)
Wells O.C: Examination of nylon spinneret holes by scanning
electron microscopy. J. Electron. Control 7, 373-376.
(1959)
1960
Everhart T.E. Simple theory concerning
the reflection of electrons from solids. J. Appl. Phys. 31, 1483-1490.
(1960)
Everhart T.E., Thornley R.F.M: Wide-band detector for
micro-microampere low-energy electron currents. J Sci Inst 37, 246-248
(1960)
Everhart T.E., Smith, K.C.A., Wells O.C. and Oatley C.W., (1960):
Recent developments in scanning electron microscopy. in Proceedings of the
Fourth International Conference on Electron Microscopy, Berlin, Sept. 1958,
Physics, Vol. I, edited by W. Bargmann et al. (Springer Verlag, Berlin, (1958))
269-273.
Sikorski J. Studies of fibrous structures. in Proceedings of the
Fourth International Conference on Electron Microscopy, Berlin Sept. 1958,
Physics, Vol. i, edited by W. Bargmann et. al. (Springer Verlag, Berlin (1960))
686-707.
Thornley R.F.M. New applications of the scanning electron
microscope. PhD Dissertation, Cambridge University (1960)
Wells O.C:
Correction of errors in electron stereomicroscopy. Brit J Appl Phys 11, 119-201
(1960)
1961
K.C.A. Smith. A versatile scanning
electron microscope. in Proceedings of the European Regional Conference on
Electron Microscopy, Delft 1960, Vol. 1 edited by A. L. Houwink and B.J. Spit
(De Nederlandse Vereniging Voor electronenmicroscopie, Delft, (1961)) pp
177-180.
Smith, K.C.A. Scanning. in "Encyclopedia of Microscopy" (G. L.
Clark, ed.), pp.241-251. (Reinhold, New York), (1961)
Thornley, R.F.M.
Recent developments in scanning electron microscopy. in Proceedings of the
European Regional Conference on Electron Microscopy, Delft 1960, Vol. i, edited
by A. L. Houwink and B. J. Spit, (De Nederlandse Vereniging Voor
Electronenmicroscopie, Delft (1961) pp
173-176.
1962
Ahmed H. Studies on
high-current-density thermionic cathodes. PhD Dissertation, Cambridge University
(1962)
Boyde, A., and Stewart, A.D.G. A study of the etching of dental
tissues with argon ion beams. J. Ultrastructure. Res. 7, 159-172.
(1962).
Boyde, A., and Stewart, A.D.G. Investigation of the erosion of
tooth sections with argon ion beam. Proc. 5th Internat. Conf. Electron Microsc.,
Philadelphia, 1962 Pap. QQ9. (1962)
McGrath, J.T., Buchanan, J.G., and
Thurston, R.C.A.. A study of fatigue and impact fractures with the scanning
electron microscope. J. Inst. Met. 91, 34-39 (1962)
Stewart A.D.G:
Investigation of the topography of ion-bombarded surfaces with a scanning
electron microscope. Proc. 5th Internat. Conf. Electron Microsc., Philadelphia,
pp D12-13 (1962)
Stewart, A.D.G. and Boyde A. Ion etching of dental
tissues in a scanning electron microscope. Nature (London) l96, 81-82.
(1962)
Thornley, F.R.M., and Cartz, L.. Direct examination of ceramic
surfaces with the scanning electron microscope. J. Am. Ceram. Sec. 45, 425-428
(1962)
1963
Ahmed, H. and, Beck, A.H.W. Thermionic
emission from dispenser cathodes. J. Appl. Phys. 34, 997-998.
(1963).
Pease R.F.W. High resolution Scanning Electron Microscope. PhD
Dissertation, Cambridge University (1963)
1964
Nixon
W.C. Scanning Electron Microscopy J. R. Microsc. Sec. 83, 213-216
(1964).
1965
Broers A.N: Selective ion beam etching
in the scanning electron microscope. PhD Dissertation, Cambridge University
(1965)
Broers A. N. Combined electron and ion beam processes for
microelectronics. Microelectron. Reliab. 4, 103-104. (1965).
Broers A.N.
Micromachining by sputtering through a mask of contamination laid down by an
electron beam. Int. Conf. Electron Ion Beam Sci. Technol. (R. A. Bakish ed)
(Pap.) 1st, 1964 Toronto, pp. 191-204. (1965)
Oatley C.W, Nixon WC, Pease
R.F.W: Scanning electron microscopy. Adv. Electronics Electron Phys 21, 181-247
(1965)
Pease R.F.W. The determination of the area of emission of
reflected electrons in a scanning electron microscope. J. Sci. Instrum. 42,
158-159. (1965)
Pease R.F.W, Nixon W.C: High resolution scanning electron
microscopy. J. Sci. Inst. 42, 81-85 (1965)
Pease R.F.W. and Nixon W.C.
"Microformation of filaments," in First International Conference on Electron and
Ion Beam Science and Technology, Toronto, May 1964, edited by R. A. Bakish
(Wiley, New York) pp 22~230. (1965)
Stewart A.D.G. and Snelling M.A. A
new scanning electron microscope, in Electron Microscopy: Proceedings of the
Third European Regional Conference, Prague, Sept. 1964, edited by M. Titlebach
(Czechoslovak Academy of Sciences, Prague), pp 55-56.
(1965)
1969
Oatley C.W. Isolation of potential
contrast in the scanning electron microscope. J. Sci. Instrum. (J. Phys. E) 2,
742-744. (1969)
1971
Catto C.J.D. Production and
Storage-Display of the Signal in the Scanning Electron Microscope. PhD
Dissertation, Cambridge University (1971)
Munro E. Computer-Aided-Design
Methods in Electron Optics. PhD Dissertation, Cambridge University
(1971)
Swann D.J. Investigations Relating to the Application of Field
Emission Cathodes. PhD Dissertation, Cambridge University
(1971)
1972
Oatley, C.W. The scanning electron
microscope. Part I. The instrument. (Cambridge University Press,
1972)
1973
Cleaver, J.R.A. The Application of Field
Emission Cathodes to the Scanning Electron Microscope. PhD Dissertation,
Cambridge University (1973)
1975
Oatley C.W.
Sixty-sixth Kelvin Lecture: The scanning electron microscope and other
electron-probe instruments. Proc. IEE, 122, 9, 942-946,
(1975)
1976
Unitt B.M. On-Line Digital Image
Processing for the Scanning Electron Microscope. PhD Dissertation, Cambridge
University (1976)
1978
Cumming A.D.G. Fluctuations
and Energy Broadening in Field Emitted Electron Beams. PhD Dissertation,
Cambridge University (1978)
1979
Hill R, Smith K.C.A
Analysis of the Single-pole Lens by Finite Element Computation. Inst. Phys.
Conf. Series No.52; 49-52 (1979)
Holburn D.M. Computer Aided Techniques
for Topographical Analysis in the Scanning Electron Microscope. PhD
Dissertation, Cambridge University (1979)
1980
Hill
R, Smith K.C.A An Interactive Computer System for Magnetic Lens Analysis. Proc
7th European Congress on Electron Microscopy; 60-61
(1980)
1981
Oatley·C.W. Detectors for scanning
electron microscope, J. Phys. E: Sci. Instrum. 14, 971-976. (1981)
Hill
R, Smith K.C.A Applications of the Cambridge Interactive Electron Lens Analysis
System: CIELAS. Inst. Phys. Conf. Series No 61; 71-74
(1981)
1982
Erasmus S.J. Real-Time Digital Image
Processing in Electron Microscopy. PhD Dissertation, Cambridge University
(1982)
Hill R, Smith K.C.A The Single-pole Lens as an SEM Objective.
Scanning Electron Microscopy; 465-471 (1982)
Hill R. Investigations
Relating to the Single-Pole Magnetic Lens. PhD Dissertation, Cambridge
University (1982)
Oatley C.W. The early history of the scanning electron
microscope. J. Appl. Phys. 53, R1-R13
(1982)
1983
Smith D.J, Camps R.A, Freeman L.A, Hill
R, Nixon W.C, Smith K.C.A. Recent Improvements to the Cambridge University 600
kV High Resolution Electron Microscope, J. Microscopy 130, Pt 2, 127-136
(1983)
1985
Oatley C.W. The detective quantum
efficiency of the scintillator/photomultiplier in the scanning electron
microscope, J. Microscopy 139, Pt. 2, 153 (1985)
Oatley C.W, McMullan D,
Smith K.C.A: The development of the scanning electron microscope. In The
Beginnings of Electron Microscopy (PW Hawkes ed) Adv Electronics Electron Phys
Suppl 16, 443-482 (1985)
1986
Breton B.C, J.T.L
Thong, W.C Nixon. A dynamic real time 3-D measurement technique for IC
inspection. Microelectronic Engineering 5: 541-545
(1986)
1987
Breton B.C, J.T.L Thong, WC Nixon.
Contactless 3-D measuring technique for IC Inspection. Proc. SPIE Integrated
Circuit Metrology, Inspection and Process Control Conference, Santa, Clara CA
Mar 4-6, Vol 775 : pp 109-117. (1987)
Thong J.T.L, SCJ Garth, B.C Breton,
W.C. Nixon. Ultra Highspeed electron beam testing system. Microelectronic
Engineering 6, 683-688. (1987)
1988
Chang M.M.Y. A
Computer-Controlled System in Transmission Electron Microscopy. PhD
Dissertation, Cambridge University (1988)
Thong J.T.L, B.C. Breton, W.C.
Nixon. High speed beam testing using an electron-optical phase shift element.
Electronics Letters 24: No: 23, 1441-2.
(1988)
1989
Atkin P. A Programmable Image Processor.
PhD Dissertation, Cambridge University
(1989)
1990
Breton B.C, Thong J.T.L, Nixon W.C.
Advances in stereo SEM techniques. Inst. Phys. Conf. Series No.98; 617-620
(1990)
Taylor J.H. Automatic Computational Methods in Magnetic Electron
Lens Design. PhD Dissertation, Cambridge University
(1990)
1991
Thong J.T.L., Breton B.C. Improving the
dynamic response of magnetic electron lenses. Meas. Sci. Technol. 2; 1116-1118.
(1991)
1992
Thong J.T.L., Breton B.C.. A topography
measurement instrument based on the scanning electron microscope. Rev. Sci.
Inst. 1992; 63(1) : pp 131-138.
Thong J.T.L., Breton B.C. In situ
topography measurement in the SEM. Scanning 14 : pp 65-72.
(1992)
1993
Chau K.L. Automated Control in High
Resolution Scanning Electron Microscopy. PhD Dissertation, Cambridge University
(1993)
1994
Fuller K., Thong J.T.L., Chambers T.J.,
Breton B.C. Automated 3-D characterisation of osteoclast resorption lacunae by
stereoscopic scanning electron microscopy. Journal of Bone and Mineral Metabolis
(1994)
Chand G. Aberrration Determination and Compensation in High
Resolution Electron Microscopy. PhD Dissertation, Cambridge University
(1994)
1996
Chand, G., Breton, B.C., Caldwell, N.H.M.
& Holburn, D.M. World Wide Web Controlled SEM. Scanning: The Journal of
Scanning Microscopies, Vol 18, (3), pp201-202. (1996).
Caldwell, N.H.M.,
Breton, B.C., & Holburn, D.M. Automated filament saturation in the SEM.
Proceedings of the Royal Microscopical Society, Vol 31, (2), pp126.
(1996)
Breton, B.C., Chand, G., Caldwell, N.H.M., & Holburn D.M. A
Java Powered SEM. Proceedings of EUREM-11, Vol 1 : Techniques and
Instrumentation, pp356, CESM. (1998).
Caldwell, N.H.M., Breton, B.C.,
& Holburn, D.M. An Expert System for Fault Diagnosis in the Scanning
Electron Microscope Applications and Innovations in Expert Systems IV (pp
177-188), SGES Publications. (1996)
1997
Agar A.W.,
Brown, P.D., Mulvey, T. & Smith K.C.A. The Curious History of the First SEM
Produced Independently by AEI Manchester. The Electron, Proc. International
Centennial Symposium on the Electron, Churchill College, Cambridge, (Ed. A.I.
Kirkland and P.D. Brown) 266-269, (1997)
Breton, B.C., Chand, G.,
Caldwell, N.H.M. & Holburn, D.M. Remote Microscopy in the Real World.
Microscopy and Analysis, September 1997, pp19-21. (1997)
Caldwell,
N.H.M., Breton, B.C., & Holburn, D.M. "FIRST A.I.D: Using Remote Microscopy
and Artificial Intelligence for SEM Fault Diagnosis" Scanning: The Journal of
Scanning Microscopies,Vol 19, (3), pp204. (1997)
Caldwell, N.H.M.,
Breton, B.C., & Holburn, D.M. Towards the Intelligent SEM. Electron
Microscopy and Analysis 1997, (Institute of Physics Conference Series Number
153), pp 53-56, Institute of Physics Publishing.(1997)
Caldwell, N.H.M.,
Breton, B.C., & Holburn, D.M. XpertEze: A Knowledge-Based Approach to
Scanning Electron Microscopy. Applications and Innovations in Expert Systems V
(pp 127-140), SGES Publications. (1997)
Chand, G., Breton, B.C.,
Caldwell, N.H.M. & Holburn, D.M. World Wide Web Controlled SEM. Scanning:
The Journal of Scanning Microscopies, Vol 19, 4, 292-296. (1997)
Edgcombe
C.J., Roberts, D.E. & Smith K.C.A. Computer-Aided Teaching of Electron
Optics. The Electron, Proc. International Centennial Symposium on the Electron,
Churchill College, Cambridge, (Ed. A.I. Kirkland and P.D. Brown) 313-317,
(1997)
Smith K.C.A. Charles Oatley: Pioneer of Scanning Electron
Microscopy. Inst. Phys. Conf. Series No 153; 9-16 (1997)
Smith K.C.A. The
Origins and History of a Versatile Electron Optical Instrument Combining
Facilities for SEM, TEM and X-ray Point Projection Microscopy. The Electron,
Proc. International Centennial Symposium on the Electron, Churchill College,
Cambridge, (Ed. A.I. Kirkland and P.D. Brown) 552-556.
(1997)
1998
Caldwell, N.H.M., Breton, B.C., &
Holburn, D.M. Remote Instrument Diagnosis on the Internet. IEEE Intelligent
Systems, Vol 13, (3), pp70-76. (1998)
Caldwell, N.H.M., Breton, B.C.,
& Holburn D.M. Making SEMs Smarter. Microscopy & Analysis, November
1998, pp9-11. (1998)
Caldwell, N.H.M. Knowledge-Based Engineering for the
Scanning Electron Microscope. PhD Dissertation, Cambridge University
(1998)
Nixon W.C. History and Early Developments of the Scanning Electron
Microscope within Cambridge University. Electron Microscopy 1998, ICEM14,
Cancun, Mexico, Symp. A, Vol. 1,
27-28.
1999
Breton, B.C., Chand G., Howard, P.J.,
Caldwell, N.H.M., & Holburn D.M. NetSEM Collaborator - An Application in
Telemicroscopy. Microscopy and Microanalysis, Vol 5, Supplement 2, pp320-321.
(1999)
2000
Holburn, D.M., Robertson, R.P.,
Breton B.C., & Caldwell N.H.M. A Virtual Scanning Electron Microscope for
Teaching and Training. Microscopy & Analysis, March 2000, pp5-7. (2000)